Electron Microscopes

Scanning Electron Microscope
Jeol JSM-6360LV

Transmission Electron Microscope
Jeol JEM-1230

Specifications:

  • high vacuum (HV) and low vacuum (LV) modes (allowing imaging of samples with higher water content and non-conductive surfaces)
  • LV mode pressure range from 1 ~ 270 Pa
  • 3.0nm resolution (WD: 6mm) in HV mode/ 4.0nm resolution in LV mode
  • magnification from 5 ~ 300,000 X
  • accelerating voltage from 0.5 ~ 30 kV
  • total traversal of stage (x: 80mm, y: 40mm)
  • z-motion from 5 ~ 48mm
  • stage tilt: -10° ~ +90°
  • 360° continuous rotation
  • max specimen size 150 mm diameter
  • Everhart Thornley detector for SEI
  • three-segment solid state BEI detector

Location: #02-21

Specifications:

  • 0.36 nm point resolution
  • magnification from 50 - 600,000 X
  • accelerating voltage from 40 - 120 kV (suitable for the analysis of 'soft' materials
  • 5 axis motors
  • Gatan CCD facilitates the acquisition of digital images

Location: #02-24