Scanning Electron Microscope


Scanning Electron Microscope(SEM):
Jeol JSM-6360LV

  Features:

  • Accelerating Voltage from 0.5 ~ 30 kV
  • High & low vacuum modes(HV & LV)
  • High Magnification from 20x - 300,000x
  • 3.0nm resolution (HV) /4.0nm(LV)
  • Z-motion from 5 ~ 48mm
  • Stage tilt: -10° ~ +90°
  • 360° continuous rotation
  • Max specimen size 150 mm
  • Everhart Thornley detector for SEI
  • 3 segment solid state BEI detector
  • JEOL SEM Imaging Software
  • Data storage using USB Flash drive
  • Excellent imaging for Biological sample, polymer, and material science applications

Location: #02-24


Researchers who are interested in SEM imaging in our facility, please contact Ouyang