TLL Microscopy and Imaging Facility

Electron microscopes

Ouyang Xuezhi
+65 6872 7032

Fiona Chia
+65 6872 7032

TLL owns a Scanning Electron Microscope and a Transmission Electron Microscope (click on the names for photos of the systems or logos for manufacturers websites).

We also have the necessary equipment for the preparation of specimens and can provide glass knives for researchers who need them for histology purposes.

Equipment includes:

Bal-Tec Critical Point Dryer
Bal-Tec Gold sputter machine
Ultrathin section microtome
Leica EMKMR2 for making glass knives

Scanning Electron Microscope
Jeol JSM-6360LV

Location: #02-21

Specifications:

high vacuum (HV) and low vacuum (LV) modes (allowing imaging of samples with higher water content and non-conductive surfaces)
LV mode pressure range from 1 ~ 270 Pa
3.0nm resolution (WD: 6mm) in HV mode/ 4.0nm resolution in LV mode
magnification from 5 ~ 300,000 X
accelerating voltage from 0.5 ~ 30 kV
total traversal of stage (x: 80mm, y: 40mm)
z-motion from 5 ~ 48mm
stage tilt: -10° ~ +90°
360° continuous rotation
max specimen size 150 mm diameter
Everhart Thornley detector for SEI
three-segment solid state BEI detector

Transmission Electron Microscope
Jeol JEM-1230

Location: #02-24

Specifications:

0.36 nm point resolution
magnification from 50 - 600,000 X
accelerating voltage from 40 - 120 kV (suitable for the analysis of 'soft' materials
5 axis motors
Gatan CCD facilitates the acquisition of digital images

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